Pressure-induced isostructural electronic topological transitions in 2H-MoTe2: x-ray diffraction and first-principles study

Synchrotron x-ray diffraction measurements on powder 2H-MoTe2 (P63/mmc) up to ~46 GPa have been performed along with first-principles based density functional theoretical analysis to probe the isostructural transition in low pressure regime and two electronic topological transitions (ETT) of Lifshitz-type in high pressure regime. The low pressure isostructural transition at ~7 GPa is associated with the lattice parameter ratio c/a anomaly and the change in the compressibility of individual layers.